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Webinar

Exploring Thermal Properties with Frequency/Time Domain Thermoreflectance

Special Guest Speaker: James Pomeroy, Co-founder at Thermap Solutions

Join C-Therm Technologies and Thermap Solutions for a live webinar on advanced thermal property measurement techniques used to solve complex heat transfer challenges in modern materials and devices.

In this session, we will explore Time-Domain Thermoreflectance (TDTR) and Frequency-Domain Thermoreflectance (FDTR), two powerful microscale thermal characterization methods used to measure thermal conductivity, thermal interface resistance, and other critical thermal transport properties in thin films, semiconductors, electronics, and advanced materials.

If you work in materials science, semiconductor R&D, electronics packaging, thermal interface materials, nanomaterials, or thermal engineering, this webinar will help you better understand when and why TDTR and FDTR are used, what information they provide, and how they fit into a broader thermal testing strategy.

In this webinar, you will learn:

  • What TDTR and FDTR are, and how thermoreflectance-based thermal measurements work

  • The key differences between TDTR, FDTR, and conventional thermal conductivity measurement methods

  • How these techniques are used to evaluate thin films, coatings, interfaces, semiconductors, and other advanced materials

  • Important instrumentation and system design considerations for accurate thermal property measurement

  • How microscale thermal metrology supports product development, failure analysis, and thermal management research

This webinar is ideal for professionals and researchers looking to improve their understanding of high-resolution thermal metrology and its practical value in real-world applications. Register now to see how TDTR and FDTR can help answer challenging questions in thermal characterization and support better material and design decisions.

Keywords: TDTR, FDTR, thermoreflectance, thermal conductivity measurement, thermal interface resistance, microscale thermal property measurement, thin film thermal conductivity, semiconductor thermal analysis, thermal metrology, advanced materials characterization, thermal transport, electronics thermal management

This webinar will air on March 26, 2026 2:00 pm GMT-3.

Register here