For Immediate Release – June 1, 2017
C-Therm will be attending the Techtextil North America trade show at the McCormick Place, Lakeside Center in Chicago, Illinois from June 20 to 22, 2017.
Techtextil North America is a dedicated show for technical textiles and nonwovens. C-Therm will be joining the show with their world-leading non-destructive TCi™ Property Analyzer for characterizing the thermal performance, such as the “warm feel” or “cool touch” of textiles, fabrics and apparels. C-Therm will be located in Booth # 1260, next to the Industry and Media area and will have a TCi™ Property Analyzer in booth for demonstration and sample testing. Interested parties are welcomed to visit and are encouraged to bring samples for demo live on site.
Earlier in 2016, C-Therm has worked with industry in forming new standard for characterizing the thermal performance of textiles. As a result, ASTM International developed a new test standard, ASTM D7984 based on C-Therm’s Modified Transient Plane Source (MTPS) technique. The TCi™ performs measurement of thermal conductivity and thermal effusivity within seconds and delivers accurate quantifiable hard data to help researchers and manufacturers characterize the touch properties of textiles and fabrics. Applications include activewear, diapers, bedding materials, thermal underwear, upholstery and etc.
C-Therm’s Managing Director, Adam Harris comments, “We work closely with industry in developing a standard technique for the touch property of textiles relating to warmth and coolness. The C-Therm TCi™ has become a global standard for characterizing the touch properties of textiles and fabrics.”
About C-Therm
C-Therm Technologies Ltd., located in Fredericton New Brunswick, Canada, provides thermo-physical characterization instrumentation for R&D, production and quality control environments. C-Therm’s flagship product – the Trident Thermal Conductivity Analyzer – delivers fast, accurate measurement of thermal conductivity and effusivity. The company also offers a powerful product line in dilatometry and process analytical technology.